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Advanced Partial Discharge Testing for Modern Power Modules

Advanced Partial Discharge Testing for Modern Power Modules

Modern power modules need PD testing that goes beyond traditional standards. This article looks at advanced diagnostic methods that help improve…


Sensor Placement Errors in High-Voltage Systems That Distort Measurements

Sensor Placement Errors in High-Voltage Systems That Distort Measurements

Improper sensor placement in high-voltage systems can lead to distorted measurements. This article explains how ground shifts, dv/dt, and layout…


Why Oscilloscope Bandwidth Specs Are Often Misleading for HV Measurement

Why Oscilloscope Bandwidth Specs Are Often Misleading for HV Measurement

Oscilloscope bandwidth can quietly change high-voltage transients and hide the real dv/dt stress, not just probe capacitance or ground inductance.


Substation Commissioning and Testing—Part 3: Field Testing

Substation Commissioning and Testing—Part 3: Field Testing

Substation field testing ensures long-term reliability. It verifies instrument transformers , circuit breakers, and protection relays against…


Practical Limitations of IEC Partial Discharge Standards in Power Modules

Practical Limitations of IEC Partial Discharge Standards in Power Modules

IEC partial standards miss dv/dt, thermal, and micro-PD effects in power modules, limiting their value for inverter-driven reliability prediction.


Five Techniques for Fast, Accurate Power Integrity Measurements

Five Techniques for Fast, Accurate Power Integrity Measurements

Learn five techniques for fast, accurate power rail integrity measurements—reduce noise, add…


Double Pulse Testing eGuide

Double Pulse Testing eGuide

This step-by-step guide describes the basic concept of double pulse testing (DPT) and the…


Designing Electronics to Pass the EMC Test Part 2

Designing Electronics to Pass the EMC Test Part 2

Part 1 discussed the conductive emission loop during a typical CE test. Part 2 will examine how to use this information to reduce the emission at…


Power Module Dynamic Test Solution Suitable Also for WBG Devices

Power Module Dynamic Test Solution Suitable Also for WBG Devices

Evaluation of power modules is important for power electronics engineers, as well as power module manufacturers, to design efficient, small form…


Optimized Sigma-Delta Modulated Current Measurement for Motor Control – Part 1

Optimized Sigma-Delta Modulated Current Measurement for Motor Control – Part 1

This article is Part 1 in a series of two. It discusses demodulation of sigma-delta coded data using sinc filters in a motor control application.…


Transformer Inspection and Testing

Transformer Inspection and Testing

Installing a transformer is more than just connecting the wires, according to the wiring diagram. The first part of the installation process…


Types of Non-Contact Testing Instruments

Types of Non-Contact Testing Instruments

There are test instruments that can sense voltages and currents without having to make electrical contact with the circuit under test. Several…


Bipolar Power Solutions for Precision Test and Measurement Systems

Bipolar Power Solutions for Precision Test and Measurement Systems

This article discusses how generating bipolar power supply systems with isolation can be a balancing act between system performance, maintaining a…


Testing for Shoot-Through in Half-Bridge Power Converters

Testing for Shoot-Through in Half-Bridge Power Converters

This article gives insight into testing for shoot-through half-bridge power converters and the influence of parasitic coupling capacitance.


Dynamic Characterization of GaN Power Semiconductor Devices

Dynamic Characterization of GaN Power Semiconductor Devices

This article highlights Keysight Technologies that overcome the challenges associated with GaN FET dynamic characterization.


Testing Gallium Nitride Devices Under Extreme Voltage and Current Stress

Testing Gallium Nitride Devices Under Extreme Voltage and Current Stress

This article focuses on the stressor of current. Parts were tested to failure under two specific conditions that demonstrate the exceptional…


Modern Clamping Systems for Testing Power Semiconductor Devices

Modern Clamping Systems for Testing Power Semiconductor Devices

This article describes the steps of development and research carried out to design a clamping system for disc semiconductors and analyzes the…


Designing a Double-Pulse Test System to Enable Correlation of Dynamic Characteristics

Designing a Double-Pulse Test System to Enable Correlation of Dynamic Characteristics

This article discusses important considerations when designing a standard DPT system used to correlate results between multiple test systems.


Measuring Soil Resistivity With the Wenner Method

Measuring Soil Resistivity With the Wenner Method

Learn how to measure soil resistivity with the Wenner Method. 


The Fall-of-Potential Method vs. the Clamp-on Tester Method

The Fall-of-Potential Method vs. the Clamp-on Tester Method

Learn about the pros and cons of the fall-of-potential method and the Clamp-on tester resistance method.