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Types of Non-Contact Testing Instruments

Types of Non-Contact Testing Instruments

There are test instruments that can sense voltages and currents without having to make electrical contact with the circuit under test. Several…


Digital Multimeter Basics

Digital Multimeter Basics

Learn how to safely and effectively use a multimeter for taking electrical measurements.


Electrical Safety Code and Standards

Electrical Safety Code and Standards

This article highlights andividuals working on electrical circuits must use proper safety measures and personal protective equipment.


How Does Flyback Synchronous Rectification Affect EMI?

How Does Flyback Synchronous Rectification Affect EMI?

This article highlights Monolithic Power Systems flyback adapter design with synchronous rectification (SR) as different from conventional set-ups…


Grounding and Bonding for High-Frequency Stimulus

Grounding and Bonding for High-Frequency Stimulus

Learn about the behavior of grounding and bonding conductors with high-frequency signals


Bipolar Power Solutions for Precision Test and Measurement Systems

Bipolar Power Solutions for Precision Test and Measurement Systems

This article discusses how generating bipolar power supply systems with isolation can be a balancing act between system performance, maintaining a…


Standards for Magnetic and Capacitive Couplers

Standards for Magnetic and Capacitive Couplers

This article highlights Infineon Technologies superior isolation capability of the coreless-transformer technology allows testing its new…


Testing for Shoot-Through in Half-Bridge Power Converters

Testing for Shoot-Through in Half-Bridge Power Converters

This article gives insight into testing for shoot-through half-bridge power converters and the influence of parasitic coupling capacitance.


Dynamic Characterization of GaN Power Semiconductor Devices

Dynamic Characterization of GaN Power Semiconductor Devices

This article highlights Keysight Technologies that overcome the challenges associated with GaN FET dynamic characterization.


Testing Gallium Nitride Devices Under Extreme Voltage and Current Stress

Testing Gallium Nitride Devices Under Extreme Voltage and Current Stress

This article focuses on the stressor of current. Parts were tested to failure under two specific conditions that demonstrate the exceptional…


Modern Clamping Systems for Testing Power Semiconductor Devices

Modern Clamping Systems for Testing Power Semiconductor Devices

This article describes the steps of development and research carried out to design a clamping system for disc semiconductors and analyzes the…


Optimizing EMI Input Filters for Switched Mode Power Supplies

Optimizing EMI Input Filters for Switched Mode Power Supplies

This article highlights a method to separate common-mode and differential-mode noise components using a dual output LISN (Line Impedance…


A Review of the Inner-Workings of a Surge Current Tester

A Review of the Inner-Workings of a Surge Current Tester

This article presents a unique surge current tester rated for 120kA, describes an innovative approach to forming the current based on MOSFETs and…


Designing a Double-Pulse Test System to Enable Correlation of Dynamic Characteristics

Designing a Double-Pulse Test System to Enable Correlation of Dynamic Characteristics

This article discusses important considerations when designing a standard DPT system used to correlate results between multiple test systems.


Designing Next Generation Surge Current Testers

Designing Next Generation Surge Current Testers

ncreasing the power capacity of semiconductors and designing devices with a rectifier element diameter of 100 mm or more both require a surge…


The Fall-of-Potential Method vs. the Clamp-on Tester Method

The Fall-of-Potential Method vs. the Clamp-on Tester Method

Learn about the pros and cons of the fall-of-potential method and the Clamp-on tester resistance method.


Modular EMI Filter Selection for AC-DC Converters

Modular EMI Filter Selection for AC-DC Converters

This article highlights XP Power modular EMI filter selection for AC-DC converters.


Success Factors of EMC in the Design Phase

Success Factors of EMC in the Design Phase

This article discusses electromagnetic compatibility and how it can prove difficult for developers and project managers.


Double Pulse Testing

Double Pulse Testing

Two or double testing is a key implement in the toolbox of power electronics engineers that enables comprehensive and accurate measurements to be…


Model Continuity From Offline Simulation to RealTime Testing

Model Continuity From Offline Simulation to RealTime Testing

The dream of many engineering managers is having a single simulation model or “digital twin” for a newly developed product or application. This…