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How Silicon Carbide can Improve Switched Power Converter Designs

How Silicon Carbide can Improve Switched Power Converter Designs

When it comes to designing power converters, wide bandgap (WBG) technologies such as silicon carbide (SiC) are now a realistic option during…


How SiC MOSFETS are Made and How They Work Best

How SiC MOSFETS are Made and How They Work Best

This article highlights Avnet Silica devices featuring STSiC Power components for SiC information.


The Demand for Seamless Characterization, Simulation and Development of Power Semiconductors

The Demand for Seamless Characterization, Simulation and Development of Power Semiconductors

This article highlights publicly-funded project MessLeha addresses this issue by defining a machine-readable data sheet to support the setup of…


Utilizing GaN with High-Performance Gate Driving

Utilizing GaN with High-Performance Gate Driving

This article highlights MinDCet GaN power stages that requires implementing an optimized gate-driver for GaN transistors.


Understanding Thermal Management of Chip-Scale GaN Devices

Understanding Thermal Management of Chip-Scale GaN Devices

This article discusses the challenges that thermal management raises due to increased power density, especially with chip-scale-packaging (CSP).


Eliminating EMC at the Source

Eliminating EMC at the Source

This article highlights Ing Buro Springett elimination of the source of the noise by replacing the mosfet with a source tabbed, Nexperia GAN063-650W.


Layout Considerations for GaN Transistor Circuits

Layout Considerations for GaN Transistor Circuits

This article is the first in a series of articles discussing three topics that can help power systems designers achieve the most out of their…


On-Chip Electrostatic Discharge Protection for ICs

On-Chip Electrostatic Discharge Protection for ICs

Learn about the electrostatic discharge (ESD) events, component ESD qualification tests, and the ESD protection strategies commonly employed in ICs.


Interpreting and Validating Dynamic Characteristics for Wide Bandgap Power Device Data Sheets

Interpreting and Validating Dynamic Characteristics for Wide Bandgap Power Device Data Sheets

This article discusses practical considerations for the measurement and extraction of dynamic power semiconductor parameters.


Chip-Embedded Technology Enables High Current Density Power

Chip-Embedded Technology Enables High Current Density Power

This article highlights TDK 3D design techniques that can help reduce parasitic losses, and improve thermal performance while also reducing the PCB…


How to Achieve Fast Switching with a High-Voltage Isolated Driver IC

How to Achieve Fast Switching with a High-Voltage Isolated Driver IC

In high switching frequency applications, the high commutation slopes of the power switches require immunity against high levels of common mode…


GaN ePower Ultrafast Switches With Integrated Gate Drivers

GaN ePower Ultrafast Switches With Integrated Gate Drivers

This article provides an example of the benefits of integrated GaN power ICs via the introduction of an integrated FET and gate driver IC.


Dynamic Characterization of GaN Power Semiconductor Devices

Dynamic Characterization of GaN Power Semiconductor Devices

This article highlights Keysight Technologies that overcome the challenges associated with GaN FET dynamic characterization.


Power Conversion with GaN-on-Si Integrated Circuits

Power Conversion with GaN-on-Si Integrated Circuits

This article details how the ascent of GaN is redefining power conversion.


Analyzing the Advantages of 100V GaN in 48V Applications

Analyzing the Advantages of 100V GaN in 48V Applications

This article describes an ultra-low parasitics Eon/Eoff measurement platform and the advantages of 100V GaN in 48V applications.


Testing Gallium Nitride Devices Under Extreme Voltage and Current Stress

Testing Gallium Nitride Devices Under Extreme Voltage and Current Stress

This article focuses on the stressor of current. Parts were tested to failure under two specific conditions that demonstrate the exceptional…


Modern Clamping Systems for Testing Power Semiconductor Devices

Modern Clamping Systems for Testing Power Semiconductor Devices

This article describes the steps of development and research carried out to design a clamping system for disc semiconductors and analyzes the…


Radiation Performance of Enhancement-Mode GaN Power Devices

Radiation Performance of Enhancement-Mode GaN Power Devices

Vertical Devices Utilizing GaN Technologies

Vertical Devices Utilizing GaN Technologies

This article discusses the NexGen's Vertical GaN™ eJFET transistors and their principles of operation.


Design Considerations for a GaN-Based High Frequency LLC Resonant Converter

Design Considerations for a GaN-Based High Frequency LLC Resonant Converter

This article discusses the benefits of commercial GaN power transistors in comparison to Si SJMOS and SiC MOS transistors for a soft-switching LLC…