JEDEC announces the publication of JEP173: Dynamic On-Resistance Test Method Guidelines for GaN HEMT Based Power Conversion Devices
JEDEC announces the publication of JEP173: Dynamic On-Resistance Test Method Guidelines for GaN HEMT Based Power Conversion Devices
Toshiba Electronics Europe GmbH today announced their range of single-supply single-gate logic devices.
Toshiba Electronics Europe GmbH today announced their range of single-supply single-gate logic devices.
Exxelia, a leading global designer and manufacturer of highly engineered passive components and high-end…
Exxelia, a leading global designer and manufacturer of highly engineered passive components and high-end electromechanical solutions, will exhibit…
On February 20, 2019, Prof. Dr. h. c. mult. Reinhold Würth opened the new site of the Würth Elektronik eiSos Quality…
On February 20, 2019, Prof. Dr. h. c. mult. Reinhold Würth opened the new site of the Würth Elektronik eiSos Quality Design Center (QDC) in the…
Xilinx Inc. and Infineon Technologies AG are jointly providing scalable power supplies for the Xilinx® Zynq®…
Xilinx Inc. and Infineon Technologies AG are jointly providing scalable power supplies for the Xilinx® Zynq® UltraScale™ + MPSoC and RFSoC…