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Test Solution Targets SiC and GaN Power Devices up to 3kV

Test Solution Targets SiC and GaN Power Devices up to 3kV

PMIC for Intel’s Next-Gen Apollo Lake Chip Architecture

PMIC for Intel’s Next-Gen Apollo Lake Chip Architecture

The World039s Fastest GaN FET Driver

The World039s Fastest GaN FET Driver

Peregrine Semiconductor Corp., founder of RF SOI (silicon on insulator) and pioneer of advanced RF solutions, introduces the word’s fastest…


Chip Resistors with Overload Rating Twice the Standard

Chip Resistors with Overload Rating Twice the Standard

40V Dual Full-Bridge PWM Motor Drive IC

40V Dual Full-Bridge PWM Motor Drive IC

Highest Power L-Band Radar GaN HEMT

Highest Power L-Band Radar GaN HEMT

3- to 5-Cell Li-ion / Li-Polymer Protection IC

3- to 5-Cell Li-ion / Li-Polymer Protection IC

1200V / 0.04Ω GaN Switches with integral ISO-DRIVER

1200V / 0.04Ω GaN Switches with integral ISO-DRIVER

GaN Enhances Efficiency of Redundant Power Supplies

GaN Enhances Efficiency of Redundant Power Supplies

10-Channel Universal Temperature Measurement IC

10-Channel Universal Temperature Measurement IC

Wide-Terminal Thin-Film 1W 0612 Chip Resistors

Wide-Terminal Thin-Film 1W 0612 Chip Resistors

0.080-Ohm 12A / 650V GaN Switches

0.080-Ohm 12A / 650V GaN Switches

220W GaN HEMT for 2.6GHz 4G Transceivers

220W GaN HEMT for 2.6GHz 4G Transceivers

Bipolar Stepper and High-Current DC Motor Driver IC

Bipolar Stepper and High-Current DC Motor Driver IC

Documenting GaN Technology Reliability after Millions of Device Hours of Rigorous Stress Testing

Documenting GaN Technology Reliability after Millions of Device Hours of Rigorous Stress Testing

This article introduces the release of EPC's Phase Eight Reliability Report showing the results of qualification stress tests of eGaN FETs and…


new products Sep 03, 2016 by EPC
Relay Driver IC with Integrated ARM Cortex M0 Core

Relay Driver IC with Integrated ARM Cortex M0 Core

1-GHz Optically-Isolated Measurements for GaN and SiC

1-GHz Optically-Isolated Measurements for GaN and SiC

LDOs in Breakthrough Bumpless Chip-Scale Package

LDOs in Breakthrough Bumpless Chip-Scale Package

Anti-Surge Thick Film Chip Resistors

Anti-Surge Thick Film Chip Resistors

Increasing Reliability Data for GaN Devices

Increasing Reliability Data for GaN Devices