EEPower

Latest Equipment Articles

Categories

Current Transducers Measure Up to 450Apk with Closed-loop Hall Effect Technology

Current Transducers Measure Up to 450Apk with Closed-loop Hall Effect Technology

new products May 08, 2019 by Paul Shepard
Dynamic Power Device Analyzer with Double-Pulse Test Capability for WBG Semis

Dynamic Power Device Analyzer with Double-Pulse Test Capability for WBG Semis

new products May 07, 2019 by Paul Shepard
Anritsu MT8862A First to Support IEEE802.11ac OTA Tests Per CTIA/WFA CWG Test Plan V. 2.1

Anritsu MT8862A First to Support IEEE802.11ac OTA Tests Per CTIA/WFA CWG Test Plan V. 2.1

new products May 07, 2019 by Scott McMahan
TDK Corporation Opens TDK-Lambda UK EMC Centre

TDK Corporation Opens TDK-Lambda UK EMC Centre

News May 06, 2019 by Scott McMahan
Programmable Coreless Hall Sensors Measure ±25A to ±120A

Programmable Coreless Hall Sensors Measure ±25A to ±120A

new products May 03, 2019 by Scott McMahan
Current Probe Offers High-Bandwidth and High Interference Immunity

Current Probe Offers High-Bandwidth and High Interference Immunity

new products May 02, 2019 by Paul Shepard
EMI Absorber and Thermal Management Material for 5G Applications

EMI Absorber and Thermal Management Material for 5G Applications

new products May 02, 2019 by Scott McMahan
EMC Filters from SMP for Modern SiC and GaN Applications

EMC Filters from SMP for Modern SiC and GaN Applications

new products Apr 28, 2019 by Paul Shepard
Hall-Effect Switch and Latch ICs with Integrated Self-Test Enhance ADAS Safety

Hall-Effect Switch and Latch ICs with Integrated Self-Test Enhance ADAS Safety

This article highlights Allegro MicroSystems APS11450 and APS12450 Hall-effect Switch and Latch ICs solutions for systems that require functional…

new products Apr 26, 2019 by Allegro MicroSystems
220W Linear Programmable DC Power Supply

220W Linear Programmable DC Power Supply

new products Apr 23, 2019 by Paul Shepard
TDK Releases Reengineered LeaXield EMC Filters To Minimize Earth Leakage Currents

TDK Releases Reengineered LeaXield EMC Filters To Minimize Earth Leakage Currents

Iselin, N.J. (March 28, 2019) – TDK Corporation today announced that it has reengineered and improved the EPCOS LeaXield™ active leakage…

new products Mar 28, 2019 by TDK Corporation
Reengineered EMC Filters Minimize Earth Leakage Currents

Reengineered EMC Filters Minimize Earth Leakage Currents

News Mar 27, 2019 by Paul Shepard
AEC-Q100 Grade 0 Hall-Effect Sensors with Integrated Self-Test for ADAS

AEC-Q100 Grade 0 Hall-Effect Sensors with Integrated Self-Test for ADAS

new products Mar 27, 2019 by Scott McMahan
Furukawa Electric Testing Witricity Wireless EV Charging 

Furukawa Electric Testing Witricity Wireless EV Charging 

News Mar 27, 2019 by Scott McMahan
Lead-Free Thick-Film High-Voltage Resistors Enable Long-Term RoHS Compliance

Lead-Free Thick-Film High-Voltage Resistors Enable Long-Term RoHS Compliance

new products Mar 26, 2019 by Paul Shepard
Analyze Wide Bandgap SMPS Designs without Building and Testing Prototypes

Analyze Wide Bandgap SMPS Designs without Building and Testing Prototypes

News Mar 19, 2019 by Paul Shepard
New Line of AC-DC Power Filters Addresses EMC and Surge Compliance

New Line of AC-DC Power Filters Addresses EMC and Surge Compliance

CUI’s Power Group today announced the addition of ac-dc power filters, designed to accompany its existing portfolio of low power embedded ac-dc…

new products Mar 19, 2019 by CUI Inc.
Worried About Gate Driver Insulation? Apply the ‘BIER’ Test

Worried About Gate Driver Insulation? Apply the ‘BIER’ Test

This article examines the effects and explains how they can be mitigated along with results of experiments to evaluate stress and damage,…

Technical Articles Mar 19, 2019 by Markus Stoger
1200A Current Probe for High-Speed and High Power-Density Measurements

1200A Current Probe for High-Speed and High Power-Density Measurements

new products Mar 18, 2019 by Scott McMahan
Protocol Analyzer Platform for Next-Generation USB4 and Thunderbolt 3

Protocol Analyzer Platform for Next-Generation USB4 and Thunderbolt 3

new products Mar 12, 2019 by Paul Shepard