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Reengineered EMC Filters Minimize Earth Leakage Currents

Reengineered EMC Filters Minimize Earth Leakage Currents


News Mar 27, 2019 by Paul Shepard
AEC-Q100 Grade 0 Hall-Effect Sensors with Integrated Self-Test for ADAS

AEC-Q100 Grade 0 Hall-Effect Sensors with Integrated Self-Test for ADAS

Furukawa Electric Testing Witricity Wireless EV Charging 

Furukawa Electric Testing Witricity Wireless EV Charging 


News Mar 27, 2019 by Scott McMahan
Lead-Free Thick-Film High-Voltage Resistors Enable Long-Term RoHS Compliance

Lead-Free Thick-Film High-Voltage Resistors Enable Long-Term RoHS Compliance

Analyze Wide Bandgap SMPS Designs without Building and Testing Prototypes

Analyze Wide Bandgap SMPS Designs without Building and Testing Prototypes


News Mar 19, 2019 by Paul Shepard
New Line of AC-DC Power Filters Addresses EMC and Surge Compliance

New Line of AC-DC Power Filters Addresses EMC and Surge Compliance

CUI’s Power Group today announced the addition of ac-dc power filters, designed to accompany its existing portfolio of low power embedded ac-dc…


new products Mar 19, 2019 by CUI Inc.
Worried About Gate Driver Insulation? Apply the ‘BIER’ Test

Worried About Gate Driver Insulation? Apply the ‘BIER’ Test

This article examines the effects and explains how they can be mitigated along with results of experiments to evaluate stress and damage,…


1200A Current Probe for High-Speed and High Power-Density Measurements

1200A Current Probe for High-Speed and High Power-Density Measurements

Protocol Analyzer Platform for Next-Generation USB4 and Thunderbolt 3

Protocol Analyzer Platform for Next-Generation USB4 and Thunderbolt 3

Real-Time Simulation and Test Systems for Power Electronics from Opal-RT

Real-Time Simulation and Test Systems for Power Electronics from Opal-RT


News Mar 11, 2019 by Scott McMahan
Simplifying IEC 61508 SIL3 Certification for Industrial Applications

Simplifying IEC 61508 SIL3 Certification for Industrial Applications


News Mar 08, 2019 by Scott McMahan
JEDEC Wide Bandgap Power Semiconductor Committee Publishes First Document Test Method for Dynamic Resistance of GaN HEMT

JEDEC Wide Bandgap Power Semiconductor Committee Publishes First Document Test Method for Dynamic Resistance of GaN HEMT

 JEDEC announces the publication of JEP173: Dynamic On-Resistance Test Method Guidelines for GaN HEMT Based Power Conversion Devices


new products Mar 01, 2019 by JEDEC
EMI Application Mode Added to Spectrum Analyzers for Pre-Compliance Analysis

EMI Application Mode Added to Spectrum Analyzers for Pre-Compliance Analysis

EPC Publishes 10th Reliability Report Highlighting GaN Device Testing Beyond AEC-Q101

EPC Publishes 10th Reliability Report Highlighting GaN Device Testing Beyond AEC-Q101


News Feb 26, 2019 by Paul Shepard
Dynamic Characterization Platform for SiC Power MOSFETs and Schottky Diodes

Dynamic Characterization Platform for SiC Power MOSFETs and Schottky Diodes

Simplified EMC Compliance Using Line Inductors Optimized for RECOM DC-DCs

Simplified EMC Compliance Using Line Inductors Optimized for RECOM DC-DCs

Multi-Device Calibrator for International Standards

Multi-Device Calibrator for International Standards

EEMBC Standardizes CoreMark Energy Measurement with New Benchmark

EEMBC Standardizes CoreMark Energy Measurement with New Benchmark


News Feb 22, 2019 by Paul Shepard
DC Energy Meter First to Receive German Certification for EV Charging Stations

DC Energy Meter First to Receive German Certification for EV Charging Stations

LEM Becomes First Company to Receive German Certification for their EM4TII DC Energy Meters

LEM Becomes First Company to Receive German Certification for their EM4TII DC Energy Meters

LEM, the market leader in providing innovative and high-quality solutions for measuring electrical parameters, is pleased to become the first…


new products Feb 21, 2019 by LEM