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Hall-Effect Switch and Latch ICs with Integrated Self-Test Enhance ADAS Safety

Hall-Effect Switch and Latch ICs with Integrated Self-Test Enhance ADAS Safety

This article highlights Allegro MicroSystems APS11450 and APS12450 Hall-effect Switch and Latch ICs solutions for systems that require functional…

new products Apr 26, 2019 by Allegro MicroSystems
220W Linear Programmable DC Power Supply

220W Linear Programmable DC Power Supply

new products Apr 23, 2019 by Paul Shepard
TDK Releases Reengineered LeaXield EMC Filters To Minimize Earth Leakage Currents

TDK Releases Reengineered LeaXield EMC Filters To Minimize Earth Leakage Currents

Iselin, N.J. (March 28, 2019) – TDK Corporation today announced that it has reengineered and improved the EPCOS LeaXield™ active leakage…

new products Mar 28, 2019 by TDK Corporation
Reengineered EMC Filters Minimize Earth Leakage Currents

Reengineered EMC Filters Minimize Earth Leakage Currents

News Mar 27, 2019 by Paul Shepard
AEC-Q100 Grade 0 Hall-Effect Sensors with Integrated Self-Test for ADAS

AEC-Q100 Grade 0 Hall-Effect Sensors with Integrated Self-Test for ADAS

new products Mar 27, 2019 by Scott McMahan
Furukawa Electric Testing Witricity Wireless EV Charging 

Furukawa Electric Testing Witricity Wireless EV Charging 

News Mar 27, 2019 by Scott McMahan
Lead-Free Thick-Film High-Voltage Resistors Enable Long-Term RoHS Compliance

Lead-Free Thick-Film High-Voltage Resistors Enable Long-Term RoHS Compliance

new products Mar 26, 2019 by Paul Shepard
Analyze Wide Bandgap SMPS Designs without Building and Testing Prototypes

Analyze Wide Bandgap SMPS Designs without Building and Testing Prototypes

News Mar 19, 2019 by Paul Shepard
New Line of AC-DC Power Filters Addresses EMC and Surge Compliance

New Line of AC-DC Power Filters Addresses EMC and Surge Compliance

CUI’s Power Group today announced the addition of ac-dc power filters, designed to accompany its existing portfolio of low power embedded ac-dc…

new products Mar 19, 2019 by CUI Inc.
Worried About Gate Driver Insulation? Apply the ‘BIER’ Test

Worried About Gate Driver Insulation? Apply the ‘BIER’ Test

This article examines the effects and explains how they can be mitigated along with results of experiments to evaluate stress and damage,…

Technical Articles Mar 19, 2019 by Markus Stoger
1200A Current Probe for High-Speed and High Power-Density Measurements

1200A Current Probe for High-Speed and High Power-Density Measurements

new products Mar 18, 2019 by Scott McMahan
Protocol Analyzer Platform for Next-Generation USB4 and Thunderbolt 3

Protocol Analyzer Platform for Next-Generation USB4 and Thunderbolt 3

new products Mar 12, 2019 by Paul Shepard
Real-Time Simulation and Test Systems for Power Electronics from Opal-RT

Real-Time Simulation and Test Systems for Power Electronics from Opal-RT

News Mar 11, 2019 by Scott McMahan
Simplifying IEC 61508 SIL3 Certification for Industrial Applications

Simplifying IEC 61508 SIL3 Certification for Industrial Applications

News Mar 08, 2019 by Scott McMahan
JEDEC Wide Bandgap Power Semiconductor Committee Publishes First Document Test Method for Dynamic Resistance of GaN HEMT

JEDEC Wide Bandgap Power Semiconductor Committee Publishes First Document Test Method for Dynamic Resistance of GaN HEMT

 JEDEC announces the publication of JEP173: Dynamic On-Resistance Test Method Guidelines for GaN HEMT Based Power Conversion Devices

new products Mar 01, 2019 by JEDEC
EMI Application Mode Added to Spectrum Analyzers for Pre-Compliance Analysis

EMI Application Mode Added to Spectrum Analyzers for Pre-Compliance Analysis

new products Feb 28, 2019 by Paul Shepard
EPC Publishes 10th Reliability Report Highlighting GaN Device Testing Beyond AEC-Q101

EPC Publishes 10th Reliability Report Highlighting GaN Device Testing Beyond AEC-Q101

News Feb 26, 2019 by Paul Shepard
Dynamic Characterization Platform for SiC Power MOSFETs and Schottky Diodes

Dynamic Characterization Platform for SiC Power MOSFETs and Schottky Diodes

new products Feb 26, 2019 by Paul Shepard
Simplified EMC Compliance Using Line Inductors Optimized for RECOM DC-DCs

Simplified EMC Compliance Using Line Inductors Optimized for RECOM DC-DCs

new products Feb 25, 2019 by Paul Shepard
Multi-Device Calibrator for International Standards

Multi-Device Calibrator for International Standards

new products Feb 25, 2019 by Scott McMahan