Langer EMV-Technik GmbH will be featuring pre-compliance measurement equipment and IC Test Systems during Electronica at booth A1-124. The company focuses on EMC and ESD testing during product development and qualification. The company's interference emission and interference immunity EMC measurement technology as well as the IC test system are used mainly in the development stage and are in worldwide demand. One of the products to be highlighted is the P331-2 probe is an ESD generator in accordance with IEC 61000-4-2. Its mini ESD generator design allows direct contact to IC pins. What is special about this ESD generator compared to conventional commercial ones is that there are no additional unintended electric and electric fields which could also interfere with the IC.
Conventional commercial ESD generators radiate electric and magnetic emissions via their housings in addition to the disturbance pulse in accordance with IEC 61000-4-2. Tests with conventional commercial ESD generators do not enable the tester to understand whether the disturbance pulse in accordance with IEC 61000-4-2 or the radiated electric or magnetic emissions are responsible for the malfunction of the IC.
The P331-2 mini ESD generator design does not allow radiated electric or magnetic emissions to emerge from its housing. It is designed for measurements on all types of IC pins, particularly for measurements on high-speed interfaces such as USB, LVDS, Ethernet, etc. Special two-pole inductive or capacitive couplers are suitable coupling networks. The P331-2 ESD generator can couple to an individual IC pin either directly or via a single-pole coupling network. The coupling networks have to be arranged externally adjacent to the IC pins. The P331-2 can be used to test an IC's ESD protection circuits. The P331-2 enables the determination of the pulse immunity levels of individual IC pins. Any IC pin can be contacted with the probe directly and individually. For measurements with a coupling network, the coupling network that is suitable for the respective measurement task is soldered to the IC pin. The circuit's behavior provides information about the respective pin's immunity level.
The P331-2 probe is supplied and controlled by the BPS 203 burst power station. The pulse voltage, pulse frequency and pulse shape can be gradually modified with the BPS-Client control software. The injected ESD pulse can thus be defined precisely and reproduced at any time. Consequently, the IC immunity can be measured precisely on each individual pin. In addition, the TS 1002 IC test accessories set is needed for the test IC measurement set-up. More accessories (oscilloscope, PC) may be required depending on the measurement task.
The IC under test is located on an IC test board in the measurement set-up. There are filtered connections to the connection board located below. The connection board is responsible for controlling and monitoring the test IC and supplying its power. The CB 0708 connection board, GND 25 ground plane and corresponding adapter boards are part of the measuring equipment (IC test system) offered by Langer EMV-Technik GmbH for such tests. The IC can be monitored precisely with a higher-level system via the connection board.
