LDR-Qualified Bipolar Transistors for Space Requirements

Semicoa Corp. has expanded its family of Radiation Hard (RH) Bipolar Transistor products by delivering Radiation Hard Bipolar Transistors built to the highest quality levels of MIL-PRF-19500 and tested to Low Dose Rate (LDR) Total Dose at a dose rate of 10 mrad(Si)/s, which includes product characterization for displacement damage effects intended for critical Space radiation environments. The LDR RH Bipolar Transistors are currently available in industry standard surface mount packages, having each wafer tested for Low Dose Rate Total Dose performance and offered under a specific Semicoa part number.

“This innovative Semicoa product offering demonstrates the commitment to providing high reliability and superior performance required by the space segment of our business,” said John Park, President of Semicoa. "Our approach represents Semicoa’s longstanding comprehension of our customer’s requirements along with continued investment and commitment meeting the needs of the Space community.”

All LDR RH Bipolar Transistors are qualified for Low Dose Rate Total Dose levels of 30 Krad(Si), 50 Krad(Si), and 100 Krad(Si) plus displacement damage characterization up to 2.0E12 n/cm2 (1 MeV-eq.). These devices will come from wafers qualified at the MIL-PRF-19500 Space Gade level and each wafer will be tested for its performance to Low Dose Rate Total Dose. Semicoa’s Enhanced Acceptance Criteria, the most stringent Rad Hard Program in the semiconductor industry, provides the same level of assurance required by most space and military programs.

Brian Triggs, Director of the Rad Hard Program at Semicoa stated, “The space community has been looking for Low Dose Rate qualified Bipolar Transistors to eliminate the costly need of up-screening Rad Hard devices to this requirement. Semicoa has responded by providing exactly what the space market desires and provides devices that are qualified to their program’s needs, thus eliminating the lot jeopardy of up-screening and the added cost of testing.”