Teledyne Lecroy Launches 1 GHz Probe, Together With New Testing Software
The probe and accompanying Power-Device software, in tandem with the company’s proven 12-bit high definition oscilloscopes, provide sharp accuracy in testing wide-bandgap semiconductor devices.
In response to a power semiconductor field ever more saturated with wide-bandgap (WGB) devices based on gallium nitride (GaN) and silicon carbide (SiC), Teledyne Lecroy on April 12 launched its new WGB-targeted DL-ISO high-voltage, optically-isolated 1 GHz probe in coordination with upgraded Power-Device testing software.
The probe and software are designed to pair with the company’s high definition oscilloscopes (HDOs), whose high sample rates and resolutions enable them to keep up with WBG devices’ rapid signals.
The DL-ISO probe, in combination with an HDO. Screenshot used courtesy of Teledyne Lecroy
Though GaN and SiC switch more than ten times faster than last-generation silicon, the completed measurement system offers accuracy to within 1.5%.
Better Testing For Newer Technology
For over a generation, designers have employed insulated-gate bipolar transistors (IGBT) and silicon metal-oxide-semiconductor field-effect transistors (MOSFETs) in power conversion systems and in power supply designs. Now, with smaller, faster, and more efficient WBG semiconductors available, consumers are demanding smaller, lighter power systems. What’s more, governments around the world are requiring greater power efficiency.
And as more engineers begin to implement WGB semiconductors into new designs, their increased switching speeds are driving calls for greater measurement bandwidth, more detailed analysis, and improved accuracy for successful incorporation of the technology.
An Overview of the System
Together with Teledyne Lecroy’s 12-bit HDOs, the probe offers 1.5% accuracy, which the company claims is nearly twice as good as its only competition, though it did not offer a name. The probe’s 1 GHz bandwidth satisfies requirements for measuring the 1 ns rise times typical of GaN semiconductors.
The HDOs themselves, of which there are four, feature bandwidths ranging from 1 to 8 GHz. They include the:
- WaveSurfer 4000HD
- WaveRunner 8000HD
- WavePro HD
Though each of the oscilloscopes offers a 12-bit resolution, the WavePro HD delivers it at a 20 GS/s sample rate, enabling the most faithful capture and display among the four.
The WavePro HD. Screenshot used courtesy of Teledyne Lecroy
As for Teledyne LeCroy’s Power-Device software package, the suite sports automated JEDEC switching loss in addition to other measurements. Useful color-coded overlays serve to highlight relevant areas of measurement for quicker analysis.
The Probe — Standout Features
The DL-ISO probe is offered in three models sporting bandwidths of 350 MHz, 700 MHz and 1 GHz. The devices feature a differential input range of 2500 V and 60 kV common mode.
Other features include:
- 435 ps rise time for capturing high dV/dT SiC and GaN waveforms
- Common-mode rejection ratio (CMRR) of 160 dB
- Flexible connectivity options (see below)
- The probe can autozero with no need to disconnect
DL-ISO probes increase designer confidence by employing high-quality coaxial attenuating tips, which serve to reject unwanted noise. The probes terminate into test boards via either industry standard MMCX connectors or high-voltage safe square pin headers.
The probe offers MMCX connectors and square pin headers. Image [modified] used courtesy of Teledyne Lecroy
The probe's three versions:
- The DL03-ISO: 350 MHz bandwidth with a 10 to 90% rise time of 1.1 ns
- The DL07-ISO: 700 MHZ bandwidth with a 10 to 90% rise time of 575 ns
- The DL10-ISO: 1 GHz bandwidth with a 10 to 90% rise time of 435 ns
- Lighting and building automation
- Residential inverters
- Switch mode power supplies
- Motors in household and commercial appliances