Maxwell Announces AARTS for Semiconductor Components

Maxwell Technologies Inc. (San Diego, CA) announced the release of its new line of Automated Accelerated Reliability Test Systems (AARTS), which are capable of performing accelerated aging performance characterization tests on discrete transistors, monolithic microwave integrated circuits (MMICs), hybrid microwave integrated circuits (HMICs), and RF/microwave module assemblies, ranging from dc to 18GHz, and 4 to 96 channels.

The product family supports 4, 8, 16 and 32 channels of capacity with full RF, DC and temperature stress capabilities. The test system consists of hardware and software used to initiate, supervise and record temperature, electrical and RF performance parameters automatically throughout the test duration. The devices-under-test are mounted in individual test fixtures that allow independent bias, temperature and RF control.

The new Automated Accelerated Reliability Test Systems start at $99,000.