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Indium Corporation Introduces Non-Silicone Based TIM for Burnin and Test

Indium Corporation Introduces Non-Silicone Based TIM for Burnin and Test

This article highlights Indium Corporation Non-Silicone-Based line of thermal interface materials (TIMs) designed for burn-in and test applications.


Mixed-Signal and Mixed-Domain Oscilloscopes Launched by Tektronix

Mixed-Signal and Mixed-Domain Oscilloscopes Launched by Tektronix

Infineon Presented New Magnetic and Pressure Sensors at Sensor+Test 2019

Infineon Presented New Magnetic and Pressure Sensors at Sensor+Test 2019

Benchtop Power Supplies with Smaller Footprint and Larger Display

Benchtop Power Supplies with Smaller Footprint and Larger Display

Everything Stays the Same: Standard Measurement Units Redefined

Everything Stays the Same: Standard Measurement Units Redefined


News May 24, 2019 by Paul Shepard
ABS to Acquire Robert Bosch Battery and Offer Production, Testing, and Manufacturing

ABS to Acquire Robert Bosch Battery and Offer Production, Testing, and Manufacturing


News May 21, 2019 by Scott McMahan
NI and OPAL-RT to Advance EV Testing Through Hardware-in-the-Loop Simulation

NI and OPAL-RT to Advance EV Testing Through Hardware-in-the-Loop Simulation


News May 20, 2019 by Paul Shepard
Accelerating Time-to-Market for High-Power Designs and Wide Bandgap Devices

Accelerating Time-to-Market for High-Power Designs and Wide Bandgap Devices

Independent Study Finds 20% of Solar Inverters Failed Safety and Reliability Testing

Independent Study Finds 20% of Solar Inverters Failed Safety and Reliability Testing


News May 15, 2019 by Paul Shepard
New Current Sensors Measure Higher Currents While Staying the Same Size

New Current Sensors Measure Higher Currents While Staying the Same Size

This article highlights LEM three new families of compact open-loop current sensors that measure higher currents than earlier sensors of the same…


Current Transducers Measure Up to 450Apk with Closed-loop Hall Effect Technology

Current Transducers Measure Up to 450Apk with Closed-loop Hall Effect Technology

Dynamic Power Device Analyzer with Double-Pulse Test Capability for WBG Semis

Dynamic Power Device Analyzer with Double-Pulse Test Capability for WBG Semis

Anritsu MT8862A First to Support IEEE802.11ac OTA Tests Per CTIA/WFA CWG Test Plan V. 2.1

Anritsu MT8862A First to Support IEEE802.11ac OTA Tests Per CTIA/WFA CWG Test Plan V. 2.1

Programmable Coreless Hall Sensors Measure ±25A to ±120A

Programmable Coreless Hall Sensors Measure ±25A to ±120A

Current Probe Offers High-Bandwidth and High Interference Immunity

Current Probe Offers High-Bandwidth and High Interference Immunity

Hall-Effect Switch and Latch ICs with Integrated Self-Test Enhance ADAS Safety

Hall-Effect Switch and Latch ICs with Integrated Self-Test Enhance ADAS Safety

This article highlights Allegro MicroSystems APS11450 and APS12450 Hall-effect Switch and Latch ICs solutions for systems that require functional…


220W Linear Programmable DC Power Supply

220W Linear Programmable DC Power Supply

AEC-Q100 Grade 0 Hall-Effect Sensors with Integrated Self-Test for ADAS

AEC-Q100 Grade 0 Hall-Effect Sensors with Integrated Self-Test for ADAS

Furukawa Electric Testing Witricity Wireless EV Charging 

Furukawa Electric Testing Witricity Wireless EV Charging 


News Mar 27, 2019 by Scott McMahan
Analyze Wide Bandgap SMPS Designs without Building and Testing Prototypes

Analyze Wide Bandgap SMPS Designs without Building and Testing Prototypes


News Mar 19, 2019 by Paul Shepard