Tektronix Launches 1100V Parametric Testing System For Wide Bandgap Technologies in Automotive Applications
Tektronix’s new testing platform targets gallium nitride (GaN) and silicon carbide (SiC) based devices to design for fast switching, wide temperature ranging, and power-efficient solutions for automotive applications at 1100V range.
Tektronix has been at the forefront of creating testing tools such as oscilloscopes, probes, and instrumentation for semiconductor fabrication for decades. Around 2010, Tektronix acquired Keithley Instruments based out of Ohio, which was the base around branching Tektronix into high volume assembly and production testing solutions.
Tektronix’s S530 platform delivers complete testing of high voltage and Low voltage parameters in a single probe touch-down. Image used courtesy of Tektronix.
Tektronix has recently announced a fast-adaptation, Keithley S530 Series, a parametric testing system with Keithley Test Environment (KTE) 7 Software. This system allows engineers to configure wide bandgap devices at high speeds in dynamic applications with each test pin capable of withstanding 1100 Volts.
Keithley S530 with KTE 7 Software in Practice
The KTE 7-based S530 platform was created for design engineers, with easily accessible testing equipment, designers will experience minimal setup/test time. The S350 is equipped with a Testhead option that enables direct docking to a prober can legacy probe while supporting card re-use and system-level calibration-on-the-pin.
The S530 has health check software tools in KTE 7 to maximize system uptime and data integrity. Image used courtesy of Tektronix.
Vice President and General Manager of Keithley/Tektronix, Chris Bohn, addressed the growing demands throughout various industries.
"Analog and mixed-signal semiconductor manufacturers continue to experience strong demand from new end-user applications in 5G communications, automotive, IoT, medical, green energy, and other markets," Bohn said.
Chris then followed with how Keithley S530 testing solution would help these industries meet their desired goals.
"This significant test platform update helps those customers bring new products to market more quickly and cost-effectively while giving them the agility to adapt to new requirements in the future,” Bohn said.
At each testing layer of the architecture of the KTE 7 diagnostic feature, there is at least one specific failure found to assist with troubleshooting. Image used courtesy of Tektronix.
The KTE 7 software includes wafer description, macro development, test data management, adaptive testing, and automatic prober control for wafer testing. An interesting feature is the system health check function, this can be performed routinely and on-demand to ensure the overall system is progressing as expected. As the instruments and correct wiring is verified, the program relays the diagnostic results back to the user in less than 15 minutes.
Protection from damage is another feature that Tektronix focused on providing with the new parametric testing system. It is common for over-current conditions to arise, especially during breakdown tests. These tests typically yield burned or melted probe card needles, destroyed devices, and damaged instrumentation.
Conventional solutions would revolve around designing current limiting resistors on each probe card, this would become time-wasting and non-cost efficient. The S530 is equipped with a built-in transient over-current and over-voltage protection modules that eliminate the need for external current limiting resistors.T
Protection modules are able to mitigate high current glitch peaks, prevent high voltages from accessing other crucial parts of the system. Image used courtesy of Tektronix.
What to Expect From the Market
Electric automotive manufacturers will be able to utilize two different models of the Keithley S530. One will be a low current system that could be used to measure characteristics such as subthreshold leakage and gate leakage up to 200V.
The second model is a high voltage system designed for monitoring process fabrication of wide bandgap power devices up to 1100V. This fully automated system-level calibration meets the latest automotive quality standards (IATF-16949) and is the only parametric testing that will provide engineers with full kelvin-voltage performance on 24 pins.
